Consecutive systems are attractive due to their potential for enhancing nano-architectures, as being able to significantly boost reliability. Additionally, communication at the nanoscale is also going to need methods allowing to achieve lower transmission bit error rates. In particular, nano-technologies like, e.g., molecular, nano-magnetic, nano-fluidic, and even FinFETs, should benefit from consecutive systems, a well-established redundancy scheme. This paper will start by briefly mentioning previous results for 1-dimensional linear consecutive-k-out-of-n:F systems with statistically independent components having the same failure probability q, before focusing on 2-dimensional consecutive systems and their variations. We shall go over a few bounds for estimating their reliability and shall present simulations for particular 2-dimensional cases. These will show that bounds are quite accurate, some of them even matching the reliability of the particular 2-dimensional consecutive systems considered. Conclusions are ending the paper.