A composition-aware model for unreliable circuits

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    As the integrated circuit geometries shrink, it becomes important for the designers to take into consideration the reliability of the circuits. Different techniques can be used for reliability calculation or estimation. Some of the techniques are accurate but time-consuming while others are quick but may not be accurate enough. This work presents a model for calculating reliability (represented by probability of failure) as a function of circuit composition, such as, number of inputs and numbers of different types of gates, etc. The model is based on data collected from the simulations of a large number of combinational circuits.

    Original languageEnglish
    Title of host publication2010 IEEE International 53rd Midwest Symposium on Circuits and Systems, MWSCAS 2010
    Pages853-856
    Number of pages4
    DOIs
    Publication statusPublished - Sep 20 2010
    Event53rd IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2010 - Seattle, WA, United States
    Duration: Aug 1 2010Aug 4 2010

    Publication series

    NameMidwest Symposium on Circuits and Systems
    ISSN (Print)1548-3746

    Other

    Other53rd IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2010
    Country/TerritoryUnited States
    CitySeattle, WA
    Period8/1/108/4/10

    Keywords

    • Failure probability
    • Nano-metric circuits
    • Neural network model
    • Reliability estimation
    • Reliability model

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Electrical and Electronic Engineering

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